Surface Analysis Laboratory (SAL)
Ìý
Who we are
The Surface Analysis Laboratory specialises in advanced surface characterisation using X-ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS), and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). These techniques enable precise determination of elemental and chemical composition, spatial distribution, and molecular structural identification of the outermost layers (the first 5–10 atomic layers) of solid surfaces. The lab is also equipped to measure variations in composition with depth, providing a comprehensive understanding of multilayered structures and interfaces.
With state-of-the-art instrumentation and extensive technical expertise, the Surface Analysis Laboratory delivers high-quality, detailed surface characterisations to support research, innovation, and materials advancements across scientific and industrial applications.
Research Collaboration
We welcome opportunities for collaborative research with academic, industry, and government partners. Our expertise in advanced surface analysis techniques – including XPS, UPS, and ToF-SIMS – enables us to support diverse research goals, from fundamental materials characterization to applied product development. Together, we can design tailored solutions to address your most challenging surface and interface questions.
Funding partners:
Capabilities
UPS Analysis
We offer Ultraviolet Photoelectron Spectroscopy (UPS) analysis to probe the valence electronic states of the very topmost surface (1~2 nm) of solid materials. By measuring the kinetic energy of photoelectrons excited by ultraviolet photons, UPS provides detailed information on the valence-band structure, density of states, and surface work function.Ìý
ToF-SIMS Mass SpectraÌý
ToF-SIMS mass spectra reveal the elemental and molecular composition of the outermost surface layers. By measuring the mass-to-charge ratios of secondary ions ejected under ion bombardment, ToF-SIMS enables highly sensitive, surface-specific detection of both organic and inorganic species.Ìý
ToF-SIMS depth profile, 3D rendering
ToF-SIMS depth profiling provides compositional information as a function of depth (sputtering time). By sequentially sputtering the surface with an ion beam and analyzing the secondary ions, ToF-SIMS enables highly sensitive, layer-by-layer characterization of elemental and molecular species within the top nanometres to micron of the materials.
Ìý
By combining sequential sputtering with surface imaging, ToF-SIMS constructs depth-resolved, spatially accurate 3D maps that reveal the complex distribution of species throughout the analysed volume.
ToF-SIMS high resolution imaging
ToF-SIMS high resolution imaging enables detailed, spatially resolved mapping of elemental and molecular species across the surface. By rastering a focused primary ion beam and detecting the resulting secondary ions, ToF-SIMS generates chemically specific images with ~100nm lateral resolution.
Instruments
-
Time-of-flight secondary ion mass spectrometer for molecular and elemental surface analysis using a bismuth cluster analysis beam. Elemental and isotopic imaging down to 100 nm lateral resolution, and Angstrom-resolution depth profiling (cesium, oxygen and argon-cluster ion beams) is also available from this instrument.Ìý
-
Thermo ESCALAB250i high-resolution X-ray Photoelectron Spectrometer (XPS) using a monochromatic Al Kalpha soft X-ray source, a monoatomic argon ion beam for depth profiling, variable-temperature stage, and He UV Source for ultraviolet photoelectron spectroscopy.Ìý
-
X-ray photoelectron spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a technique for analysing the surface chemistry of a material. XPS can measure the elemental composition, chemical state and electronic state of the elements within a material.Ìý
Our people
Fees
At the Surface Analysis Laboratory, we provide fee-for-service analysis.
ºÚÁÏÍø´óʼÇ-subsidised rate: (for ºÚÁÏÍø´óÊÂ¼Ç users only)
ToF-SIMS
The ºÚÁÏÍø´óʼÇ-subsidised access fee of $100 per hour instrument time is the same for all modes of operation.
1. Service - staff to conduct measurement with the guide from user, instrument operation only, no data analysis.Ìý
2. Analysis -Ìýstaff to design and conduct experiment with intellectual input,Ìýprovide standard analysis report together with the relevant interpreted data. An additional $100/hour will apply based on the instrument time.
3. Collaborative research*: staff to design and conduct experiment with intellectual input,Ìýprovide standard analysis report together with the relevant interpreted data.
*Collaborative research typically leads to co-authorship publication orÌýÌýÌý other forms of research output.
XPS
1. Standard Full Analysis: $100/SampleÌý Survey Scan + Region scans + Curve fitting and quantificationÌýÌýÌýÌýÌýÌýÌý Ìý
2. Data Collection Only: $50/Sample
Survey Scan + up to 6 region scansÌýÌýÌý Ìý ÌýÌýÌýÌýÌýÌýAdditional region scans - $10/Scan
3. Depth Profile: $100/hour
ÌýUPS: $50/Sample
External academic and industry rate: Higher fees apply (+GST)
Note: All fees are subject to annual CPI adjustments.
How to access
- To schedule a consultation or arrange training, please contact us directly.Ìý
- A sample analysis request form is required forÌýXPSÌý/ÌýToF-SIMSÌýanalysis.
-
-
To start the onboarding process, simply sign up to ºÚÁÏÍø´óʼÇ's ACLS booking system (button below). Once registered you can chooseÌýSurface Analysis Laboratory from the list of facilities to reserve time on the instruments.
-
Once you have completed the registration, you'll get an email detailing the next steps for onboarding. This email will include a link to a form where you can describe your project. Based on your needs, we will tailor a team to meet with you and address your requirements.
-
During this meeting, we will explain how to gain access to our lab space and what training will be required. Additionally, we will discuss your research project to match you with the most suitable instrument for your research question.
-
Access will be granted once you complete your online lab induction and receive in-person training from our staff on all relevant instruments. Our training is thorough and designed to accommodate individuals who have no prior experience with technical equipment.
-
Surface analysis involves the analysis of the top 1-10 nm of the sample; thus, it is extremely sensitive to any sample preparation treatments. There is typically a residue related to any pre-treatment of the sample, and "adventitious" (or environmental) contamination in the form of compounds absorbed onto material surfaces from the atmosphere might always be present.Ìý
In general, we analyze samples "as received." Guidelines on how to prepare your samples for the best outcomes are available in the sample preparation document.
-
Surface Analysis Lab provides free access for users to submit samples and request forms from 8am-6pm on workdays. You can drop off your samples and request form on our sample submission table during this time.ÌýWe will do the analysis for you.Ìý
-
Results will be available within one week from when your samples and request form are well received.
-
Contact us
Surface Analysis LaboratoryÌý
Room G61
F10 June Griffith Building (Chemical Sciences)Ìý
ºÚÁÏÍø´óÊÂ¼Ç SydneyÌýNSW 2033
Phone: 02 9385 4694
Email:Ìýsurfacelab@unsw.edu.au
We like to hear from you. If you have questions, requests or ideas for collaboration, please complete the contact form and we will be in touch within five business days.
Resources
Sample requirements for surface analysis
- Format
- Size
- 110 KB
Get in touch about your project
We offer a range of services that can be tailored to your needs. Please send us an enquiry to get started.
