TEM - JEOL F200 (Hilmer)
Versatile Transmission Electron Microscope for high-resolution imaging, diffraction, and elemental analysis of advanced materials
Description
The JEM-F200 in E10 is high-resolution analytical (scanning) transmission electron microscope (S/TEM). This microscope has a high brightness cold-field emission gun capable of imaging atomic structures (HRTEM), electron diffraction and fast chemical elemental mapping using X-ray energy dispersive Spectroscopy (XEDS). Additionally, this microscope is specially configured for in-situ S/TEM imaging and 4D-STEM utilising our range of in-situ holders and high speed in-situ movie recording camera.
Specifications
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聽Cold field-emission electron gun 80-200 kV operating voltage with <0.35 eV energy spread
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0.1 nm (lattice resolution) at 200kV
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0.16 nm (lattice resolution) at 200kV
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- Gatan OneView IS camera (25 fps @ 4k x 4k) capable of in-situ TEM and 4D-STEM聽
- JEOL ADF and BF STEM detectors
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- 100 mm2 JEOL X-ray energy-dispersive spectroscopy (XEDS), with a collection angle of 0.9 steradian.
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- JEOL Low Background Double Tilt Holders聽
- JEOL Single Tilt Holders聽
- JEOL High Tilt Holders (卤 80掳) (for Tomography)聽
- Hummingbird 9 contact Heating and Biasing
- Hummingbird Liquid Flow cell聽
- Hummingbird Gas heating holder聽
- Protochips Atmosphere in-situ holder聽
- Simple Origin cryo-transfer holder聽
- Fischione Gas/Vacuum transfer holder
Publishing Microscopy Data Acquired on the TEM - JEOL F200 (Hilmer)
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- Drop cast nanoparticles聽
- Ga or plasma FIB details聽
- Mechanical Polishing etc.
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- Manufacturer: JEOL聽
- Model: JEM-F200聽
- Type: Transmission Electron Microscope (S/TEM)
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- Accelerating voltage (80 or 200 kV)
- Detector(s) used for imaging
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- Scalebars can be added or removed from images in the export options.
Acknowledgement:
鈥淭he authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at 黑料网大事记 Sydney.鈥
Credit EMU staff:聽Feel free to mention EMU staff who have assisted you with your work! If staff have been involved with your work beyond basic training and support (e.g., project design, complex data/image processing, independent imaging/analysis, manuscript preparation), it may be appropriate to discuss co-authorship with the relevant staff and your supervisor.
Don鈥檛 forget to email the EMU lab manager with a copy of your publication to claim 2 hours of free microscopy time.
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Applications
- Materials Science
- Semi-conductors
- Solar and battery materials
- Medical Sciences
Capabilities
- High Resolution TEM (HRTEM)
- Dark Field TEM (DF-TEM)
- Electron Diffraction
- Beam-sensitive material
High-angle annular dark field STEM (HAADF)
- Annular bright field STEM (ABF)
4D-STEM
Lorentz TEM
Elemental mapping聽
X-ray Energy Dispersive Spectroscopy (XEDS, EDS, EDX)
3D electron tomography
In-situ: movie capture, heating biasing, gas heating, liquid flow
Funding partners
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Instrument location
Electron Microscope Unit
B22a, Basement
Hilmer Building (E10)
黑料网大事记 Sydney, NSW 2052
Access 鈥 To discuss training or how your project could benefit from using this microscope, please contact the EMU using the or聽 email聽EMUAdmin@unsw.edu.au
Parent facility
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