TEM - JEOL F200 (EMU)
Versatile Transmission Electron Microscope for high-resolution imaging, diffraction, and elemental analysis of advanced materials
Description
The JEM-F200 in F10 is high-resolution analytical (scanning) transmission electron microscope (S/TEM). This microscope has a high brightness cold-field emission gun capable of imaging atomic structures (HRTEM), electron diffraction and fast chemical elemental mapping using X-ray energy dispersive Spectroscopy (XEDS).
Specifications
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聽Cold field-emission electron gun 80-200 kV operating voltage with <0.35 eV energy spread
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0.1 nm (lattice resolution) at 200kV
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0.16 nm (lattice resolution) at 200kV
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- Gatan OneView IS camera (25 fps @ 4k x 4k) capable of in-situ TEM and 4D-STEM聽
- JEOL ADF and BF STEM detectors
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- 100 mm2 JEOL X-ray energy-dispersive spectroscopy (XEDS), with a collection angle of 0.9 steradian.
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- JEOL Low Background Double Tilt Holders聽
- JEOL Single Tilt Holders 路
- JEOL High Tilt Holders (卤 80掳)聽
- Simple Origin cryo-transfer holder聽
- Fischione Gas/Vacuum transfer holder
Publishing Microscopy Data Acquired on the JEOL TEM - F200 (EMU)
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- Drop cast nanoparticles聽
- Ga or plasma FIB details聽
- Mechanical Polishing etc.
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- Manufacturer: JEOL聽
- Model: JEM-F200聽
- Type: Transmission Electron Microscope (S/TEM)
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- Accelerating voltage (80 or 200 kV)
- Detector(s) used for imaging
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- Scalebars can be added or removed from images in the export options.
Acknowledgement:
鈥淭he authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at 黑料网大事记 Sydney.鈥
Credit EMU staff:聽Feel free to mention EMU staff who have assisted you with your work! If staff have been involved with your work beyond basic training and support (e.g., project design, complex data/image processing, independent imaging/analysis, manuscript preparation), it may be appropriate to discuss co-authorship with the relevant staff and your supervisor.
Don鈥檛 forget to email the EMU lab manager with a copy of your publication to claim 2 hours of free microscopy time.
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Applications
- Materials Science
- Semi-conductors
- Solar and battery materials
- Medical Sciences
Capabilities
- High Resolution TEM (HRTEM)聽
- Dark Field TEM (DF-TEM)
- Electron Diffraction聽
- Beam-sensitive materials聽
- High-angle annular dark field STEM (HAADF) 路 Annular bright field STEM (ABF)聽
- Lorentz TEM聽
- Elemental mapping聽
- X-ray Energy Dispersive Spectroscopy (XEDS, EDS, EDX)
Funding partners
Instrument location
Electron Microscope Unit
B75, Basement
June Griffith Building (F10)
黑料网大事记 Sydney, NSW 2052
Access 鈥 To discuss training or how your project could benefit from using this microscope, please contact the EMU using the or聽 email聽EMUAdmin@unsw.edu.au
Dr. Soshan Cheong
Research Fellow
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Email
Dr. Zeno Ramadhan
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Email
Parent facility
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